GTE Omni Si Database Technical Practices Manual

							 r52108187M-335 TL-130200-1001
Table 8.1Recent Change Sequences (Continued)
FUNCTIONTRANSACTION
NUMBERCOMMENTSShow CIP card location
and assigned ports.221,146Show CIP card location
ShowVCIP or DVCIPcard location and
assigned ports.221
146Show VCIP or DVCIP card
location.
Show lines on a 
VCIP or
DVCIP card.
Add a CAS 
Main- or
ACD agent.111
115
43
142Add instrument data.
Add line feature data.
Add agent group
Change supervisor
status association.
Delete a CAS Main
or ACD agent.115 (or 111) 
_Delete phone.
Add Asynchronous
Packet Manager (APM)
or Synchronous Packet
Manager (SPM).
146Add data device.
Delete APM or SPM.
Add a NIC
146
221, 161153,168Delete data device.
Add a trunk to a NIC trunk
groupAdd a trunk to a NIC trunk
group and set up a
nailed connection. 
						

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OFF-LINE9.0 The off-line maintenance disk contains the software for
DIAGNOSTICSconducting off-line diagnostic testing. Diagnostic tests are only
performed on off-line equipment because the generic and data
base software are voided when the maintenance disk is is loaded
into the system.
The following tests are conducted using the Off-Line
Diagnostics Testing Program:
* Line Cards and Direct-Inward-Dialing (DID) Trunk Cards
0 System Memory
o Channel Memory
0 Network
o Disk Drive
l Page, Tone, and 
ATT12 Cards
o Touch-Calling Receivers
Physical Locations9.1 During off-line diagnostic testing, the technician must, at
times, enter physical locations according to file, group and card
slot number. The 
OMNI SI universal card slots are organized
according to PCMUS Group (letters A, B, C and D) and card slot
number (numbers 0 thru 11). The universal line/trunk slots are
labeled as follows:1 C6 
C5C4C3 C2 ClC7 C8 C9 Cl0 Cl1DOD1 D2D3D4D5D6D7D8DgDlODllEXPANSION FILE
5210
A0 A2 A4 A7 A8 A9 A10 AllBO 82 B3 B5 B7 88 B9 BllGET STARTED FILE
Test Options Menu9.2 Menu numbers are assigned to each test option. In order to
run a certain test, the technician types in the menu number on
the maintenance terminal and follows the program prompts. The
menu of test options for off-line diagnostic testing appears in
Table 9.1.
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Table 9.1Menu of Test Options
Menu No.Test Option
0SYSTEM MEMORY TEST
1CHANNEL MEMORY TEST
2PAGING CARD TEST
3NETWORK TEST
4DISK DEVICE TEST
5SERIAL DEVICE CONTROLLER TEST
ITONE CARD TEST1 ATT12 CARD TEST
I
8ILINES/TRUNKS TEST1 TOUCH CALLING RECEIVER TEST1
Loading the Program9.3 The following steps load the Off-Line Maintenance
Program:
1. Place the program disk into the disk drive.
2. Connect the maintenance terminal to the NSDC card 
(FB-20992-A), port 0.
3. Press the reset button on the PSUPY card (FB-17197-A)
located in slot 
Pl of the cabinet power file.
- Flashing red LED on the disk drive indicates the program is
loading into the system.
4. Program loads into system memory on instruction page 1.
5. When the program has been loaded, set the baud rate at 300,
or 1200. Press the return key to lock in the baud rate.
6. The terminal display appears:
THE GTE 
OMNI SI DIAGNOSTIC DISK
DOES THIS SYSTEM HAVE AN EXPANSION FILE?
IF YES, TYPE “Y”, IF NOT TYPE “N”.
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7. Answer the prompt by typing 
“Y.” or “N. “ The Menu of Test
Options appears on the terminal display screen. Choose the
test and type the menu number.
8. The test selected runs with the results shown on the terminal
screen
NOTES:
1. Type “CONTROL-C 
“ to abort a test. The Menu of Test
Options appears on the terminal screen.
52102. Type “CONTROL-X” to restart a System Memory or Channel
Memory test. This entry also aborts other diagnostic tests.
3. Except for the System Memory test, any test can be
immediately repeated. After completing one test, the user can
select another from the menu list when it appears on the
screen.
9.4 Memory tests identify failures in cards. The programs work
by writing various test patterns into memory and reading them
back after a default or user-specified delay. Memory testing is
entirely automatic or partially manual/partially automatic. If
entirely automatic, defaulted or modified time delays are used.
Manual testing detects soft memory faults in which CPU
operation is interrupted for a time period set by the user. Manual
testing consists of the first two of a set of four tests used in
memory testing. The first two tests write data patterns “00” and
“FF” throughout the entire memory range with a user specified
delay between the write and read. 
Manu.al testing runs with all
pages or just one page, and with all ranges or just one range.
The following events occur as part of manual testing:
1. Type in first test pattern “00”
2. Terminal indicates that CPU is in waiting state.
3. Wait for desired amount of time delay between write and read
functions. Type 
I‘$“ to begin read-back portion of test.
- Card is tested for memory storage ability. Test results are
displayed on the terminal screen.
4. WAIT message reappears on terminal screen. Repeat process
by typing in second test pattern “FF. 
“5. Wait for desired amount of time delay between read and write
functions. Type 
I‘$“ to begin read-back portion of the test.
Results are displayed on the terminal screen.
8t87M-339 
						

							TL-130200-1001Automatic Testing9.5 After all manual tests are completed, the program changes
over to automatic testing with test results displayed as before.
Automatic testing repeats tests one and two under CPU control
with a one-second delay between write and read. Test three
writes all possible data patterns into each address location with
data in the adjacent address location incremented by one.
Example:
. .If address A000 contained a data pattern of “01 “, successive
address locations in test three appear as follows:
M-340
Address
A000
A001A002
A003
A004
Pass #l
Data
01
02
03
04
05
Pass #2
Data
02
03
04
05
06
Pass #255
Data
FF
00
01
02
03
Pass #256
Data
00
01
02
03
04Every address location is tested with every data pattern. Tests
are also conducted for internal memory chip errors such as
multiple address activation, adjacent memory cell interaction,
and data bridging. All 256 individual write/read trials are
performed in test three with the data base pattern “01“ through
“00” displayed during each testing sequence.
Test four increments the data written into each block of one
hundred hexadecimal addresses. Checks are made for address
decoding errors, multiple memory chip activations, and memory
location with all possible data pattern combinations. As with test
three, 256 individual trials are performed with the data base
pattern displayed during each sequence. Test results are
displayed at the end of the trial sequence following test three and
test four.
The delays for all tests can change to meet certain conditions.
Tests one and two default to one second between write and read.
Tests three and four are set not to delay because of the time
involved in writing all possible combinations in all memory
locations. If the delays are changed in tests three and four, the
time it would take to run these tests could be extremely long.
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							TL-130200-1001Fast Test Option
Retest Option
System
Memory Test9.6 Fast test option reduces the amount of time spent running
memory tests. This is done by using a shorter data pattern which
reduces the number of patterns written to memory in tests three
and four.
9.7 Automatic testing restarts the retest option if no failures have
occurred. If a failure does occur, testing stops and the results of
all ranges are displayed in circular order.
9.8 This test checks the ability of system memory to
store information on the One Megabyte Memory card 
(FB-17314-A -lA) and the Multiprocessor Buffer 8085 card 
(FB-17215-A). One memory page, or part of a memory page, can
be selected for testing. The “all or one page“ option selects the
number of pages. The “page set“ option selects the exact page.
The amount of memory tested is defined by range numbers.
System memory is divided into blocks of memory addresses
called ranges with each assigned a number used for memory
testing purposes only. The blocks of memory addresses and
range number assignments appear in Table 9.2.
There is a relationship between range numbers and their
physical location on a circuit card. Excluding part of the memory
from testing limits the amount of information about the card. Full
memory tests should be run in order to obtain as much
information about the card as possible.
The System Memory Test cannot be repeated without loading the
maintenance disk into memory. The memory content is the last
test pattern used in the actual test when the System Memory Test
is completed.
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Table 9.2 S‘stem Memar Test Card and Address Range Correlation
IO-17
Dl-D7
Range No. AddressRangeDo (2,3)
Range No.Card SlotFunction
I0200 to IFFF
0860 to 08BF1
 OAOO to OABF
/OCOOPad Memory
(both files)
1000 to 13FF
coY5Common Memory
Get Started File
ClY4Common Memory
Expansion Fife 1400 to 17FF
(  2050 to 
3FFF2Yl
Yl2
3
IYlI
4
5
6
7
COO0 to DFFF
EOOO to FFFF8
NOTES:
1. Range 1 does not exist for Il. I1 contains the Off-Line
Diagnostic Program at range 1 during the test.
2. Ranges A, B, and P will always be tested.
3. Ranges CO and Cl are tested only if data page 0 is tested.
Range 0 is tested if common memory tests were specified.
Range Cl is tested if both common memory tests were
specified and the Expansion File was specified in the system’s
configuration when testing was started.
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_’System Memory9.8.1
Testing ProceduresUse the following steps to conduct the System Memory
Test:
1. Select option “0“ from the Menu of Test Options. The system
responds:
Fujitsu GTE 
OMNI SI SYSTEM MEMORY TEST
TO DEFAULT ALL VALUES TYPE 0 OTHERWISE TYPE 1
2. If all values are to stay at their default values type 
“0” If not,
type “1.” If a “0” value was typed, the test begins. If a “1” was
typed, the system responds:
ALL PAGES TYPE 0; OTHERWISE TYPE 
43. If all data and instruction pages are tested, type a 
“0”;otherwise, type “1” If 
“0” was typed, go to step 5; otherwise,
the system responds:
r----------------------------------------------------~;  TO TEST A 
SINGEL PAGE, TYPE PAGE #I
I;  (0-INST 
O/l-INST l/2-DATA O/3-DATA 1)I
I;  
(4-INST2/5-INST3/6-QATA 2/7-DATA 3)II
;  (8-INST 
4/9 INST 5/l 0 DATA 4/l 4 -DATA 5)II;  (12-INST-6/13-INST 7/14-DATA 6115~DATA 7)IIIL,---------------------------------------------------~4. Type the number that matches the page tested. The system
responds:
FOR COMMON MEMORY TEST TYPE 0 /NO TEST TYPE 1
5. If common memory is tested, type 
“0”; otherwise, type “1” The
system responds:
FOR RETEST TYPE 
O/ SINGLE TYPE 1
6. If testing is to continue after a complete pass on all pages and
ranges selected, type “0.”If only one pass is desired, type
” 1 ” .The system responds:
TO RUN FAST TEST TYPE 0 LONG TEST TYPE 1
7. If the short memory test is used, type 
“0.” The short test does
not do any of the extensive address checking, nor does it have
a delay between the write and read of a memory location. The
short memory test detects all hard errors and some soft errors.
If the normal test is desired, type 
” I”. The system responds;
52108187M-343 AUTO TEST TYPE 
01 MANUAL TYPE 1 
						

							TL-130200-1001
8. If automatic delay (under system control) is used, type “0”.For manual time delay, type “1 
“. The system will respond:
TO DEFAULT INTER TEST TIME DELAY TYPE 0,
OTHERWISE TYPE 1
9. If default values are used, type 
“0” and tests begin. If other
time values are used, type 
” 1.” The system responds:
FOR EACH TEST’S DELAY TIME, TYPE TWO DIGITS:
XX 
- FOR # OF SECONDS DELAY IN TEST 1 & 2
10.Enter values from “00“ to “FF” for the time delay on tests 1
‘*and 2 (“00” means no time delay, “FF” means 255
seconds). The system responds:
XX 
- FOR # OF SECONDS DELAY IN TEST 3
11.Enter values from “00” to “FF“ for the time delay on test 3.
The system responds:
XX 
- FOR # OF SECONDS DELAY IN TEST 4
12.Enter values from “00 “ to “FF “ for the time delay on test 4.
Test Results9.8.2 All of the test results described may not appear since they
depend on how the System Memory Test was set up. A
response should appear for each range tested.
1. Page location and range number are printed as each range
passes test 
1, 2, 3, and 4. The pages appear as follows:
- For Instruction Page 0, a “CO” precedes the range #
- For Instruction Page 1, a “Cl “ precedes the range #
- For Instruction Page 2, a “C2” precedes the range #
- For Instruction Page 3, a “C3“ precedes the range #
- For Instruction Page 4, a “C4” precedes the range #
- For Instruction Page 5, a “C5“ precedes the range #
- For Instruction Page 6, a “C6” precedes the range #
- For Instruction Page 7, a “C7” precedes the range #
- For Data Page 0, a “DO” precedes the range #
- For Data Page 1, a “Dl I‘ precedes the range #
- For Data Page 2, a “D2” precedes the range #
- For Data Page 3, a “D3“ precedes the range #
- For Data Page 4, a “D4“ precedes the range #
- For Data Page 5, a “D5” precedes the range #
- For Data Page 6, a ” D6” precedes the range #
- For Data Page 7, a ” D7” precedes the range #
2. If a failure does occur, the following sample message appears
on the terminal screen:
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